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i-Sample Holder |
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The i-Sample Holder is a highly versatile variable temperature sample holder with integrated temperature reading. Samples can be heated radiatively or by electron bombardment. A modular design guarantees high flexibility in sample type and shape and an easy and quick sample mounting. The i-Sample Holder is compatible with several commercial Scanning Probe Microscopes. |
Samples
Temperature measurement
Sample heating
Sample cooling
Technical data |
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  max. sample lateral size |   9 mm |
  max. sample height |   dependent on application |
  thermocouple |   type K (5-1500 K)   others on request |
  sample heating |   up to 500 K (radiative)   up to 1200 K (e-beam) |
  max. filament HV |   -1.2 kV |
  max. emission current |   18 mA |
  sample cooling* |   down to 97 K (LN2)   down to 40 K (LHe) |
  * sample holder mounted on Dodecon Universal Manipulator Sample Stage |
Atomically resolved Scanning Tunneling Microscopy image of a Ag(001) surface obtained with the Dodecon i-Sample Holder. |
© 2018 Dodecon Nanotechnology |